Designed for component and shortrun network testing and troubleshooting, the OBR 46XX series enables ultra-high resolution reflectometry with backscatter-level sensitivity. With sampling resolution as low as 10 microns, zero dead zone, an extremely low noise floor, and options for extended range and distributed temperature and strain sensing, the OBR 4600 offers industry leading reflectometry technology that allows you to “see inside” your components and systems like never before.
Figure 1 : OBR 4600 Optical Backscatter Reflectometer
Devices built on a silicon photonic platform represent a high level of functionality miniaturized into an extremely high packaging density. The high spatial resolution and high sensitivity of the OBR 46XX offer the capability to see Inside the device with a very high level of detail. For example, the Optoelectronics Research Group at UCSB fabricated a one meter spiral delay line on a silicon platform. The OBR 4600 was used to measure the distributed loss inside the photonic integrated circuit (PIC), which measured only 1 cm2 in size. A scan of the horizontal portion of the waveguide that crosses over the spiral is shown in the graph below. The waveguide crossings, spaced at just 50 microns, are clearly visible.
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Figure 2 : (left) actual size of spiral delay line on PIC – 1cm²; (right) one meter spiral delay line circuit
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Figure 3 : OBR trace of : (up) the whole spiral and (down) the horizontal portion of the waveguide that crosses over the spiral (underlined in blue)
KEY FEATURES :
• “Zero Dead Zone” reflectometer
• Measure 30 m with 10 μm sampling resolution
• 80 dB dynamic range
• Backscatter-level sensitivity (-130 dB)
• High-speed scanning (1 m segments at up to 3 Hz)
• Extended range provides 2 km range with no dead zone
• Measure IL, RL, distributed loss, distance, polarization states, phase derivative and group delay
• High resolution C and L band (OBR4600) or O band (OBR 4613) capability and also for 1060nm (OBR4610).